{"id":14628,"date":"2025-09-03T11:52:40","date_gmt":"2025-09-03T09:52:40","guid":{"rendered":"https:\/\/eloya.be\/?post_type=nieuws&#038;p=14628"},"modified":"2025-09-03T12:02:21","modified_gmt":"2025-09-03T10:02:21","slug":"seminaire-gratuit-en-anglais-techniques-avancees-de-test-et-de-depannage","status":"publish","type":"nieuws","link":"https:\/\/eloya.be\/fr\/actualit\u00e9s\/seminaire-gratuit-en-anglais-techniques-avancees-de-test-et-de-depannage\/","title":{"rendered":"S\u00e9minaire GRATUIT (en anglais) : Techniques avanc\u00e9es de test et de d\u00e9pannage"},"content":{"rendered":"\n<h2 class=\"wp-block-heading\">Programme :<\/h2>\n\n<p class=\"wp-block-paragraph\"><span style=\"font-weight: 400;\"><strong>08h30<\/strong> &#8211; Accueil et mot de bienvenue <\/span><span style=\"font-weight: 400;\">par Bernard Benker (Control &amp; Protection) + Peter Wienhold (Megger) (anglais)<\/span><\/p>\n\n<p class=\"wp-block-paragraph\"><span style=\"font-weight: 400;\"><strong>09h00<\/strong> &#8211; Introduction aux essais statiques <\/span><span style=\"font-weight: 400;\">par Joseph Di Crea (Megger) (anglais)<\/span><\/p>\n\n<p class=\"wp-block-paragraph\"><strong>Diagnostic et surveillance des syst\u00e8mes d\u2019isolation des machines \u00e9lectriques :<\/strong><\/p>\n\n<ul class=\"wp-block-list\">\n<li>R\u00e9sistance d\u2019isolement<\/li>\n\n\n\n<li>Tests de haute tension CA et CC<\/li>\n\n\n\n<li>Indice de polarit\u00e9 CC<\/li>\n\n\n\n<li>Tests d\u2019impulsion<\/li>\n\n\n\n<li>Tan Delta<\/li>\n\n\n\n<li>D\u00e9charges partielles<\/li>\n<\/ul>\n\n<p class=\"wp-block-paragraph\"><\/p>\n\n<p class=\"wp-block-paragraph\"><span style=\"font-weight: 400;\"><strong>10h30<\/strong> &#8211; Atelier et d\u00e9monstrations \u2013 Baker ADX, MTR105, MIT &amp; ICMflex&#13;\n<\/span><span style=\"font-weight: 400;\"><strong>13h00 <\/strong>&#8211;\u00a0Lunch et networking&#13;\n<\/span><span style=\"font-weight: 400;\"><strong>14h00<\/strong> &#8211; Atelier et d\u00e9monstrations \u2013 Baker EXP4000&#13;\n<\/span><span style=\"font-weight: 400;\"><strong>16h30<\/strong> &#8211; Cl\u00f4ture de s\u00e9minaire<\/span><br\/><br\/><span style=\"font-weight: 400;\">\u00a0<\/span><\/p>\n\n<h2 class=\"wp-block-heading has-text-align-center\">La participation est gratuite mais l\u2019inscription est obligatoire via: marketing@control-protection.be<br\/><\/h2>\n\n<p class=\"has-text-align-center wp-block-paragraph\">Veuillez indiquer:<\/p>\n\n<p class=\"has-text-align-center wp-block-paragraph\"><span style=\"font-weight: 400;\">Nom de l\u2019entreprise, <\/span><span style=\"font-weight: 400;\">Nom + Pr\u00e9nom, <\/span><span style=\"font-weight: 400;\">Num\u00e9ro de t\u00e9l\u00e9phone\/GSM et <\/span><span style=\"font-weight: 400;\">Adresse e-mail<\/span><\/p>\n\n<p class=\"wp-block-paragraph\"><\/p>\n","protected":false},"excerpt":{"rendered":"<p>Programme : 08h30 &#8211; Accueil et mot de bienvenue par Bernard Benker (Control &amp; Protection) + Peter Wienhold (Megger) (anglais) 09h00 &#8211; Introduction aux essais statiques par Joseph Di Crea (Megger) (anglais) Diagnostic et surveillance des syst\u00e8mes d\u2019isolation des machines \u00e9lectriques : 10h30 &#8211; Atelier et d\u00e9monstrations \u2013 Baker ADX, MTR105, MIT &amp; ICMflex&#13; 13h00 [&hellip;]<\/p>\n","protected":false},"author":43,"featured_media":14627,"parent":0,"template":"","class_list":["post-14628","nieuws","type-nieuws","status-publish","has-post-thumbnail","hentry"],"_wpml_post_translation_editor_native":null,"yoast_head":"<!-- This site is optimized with the Yoast SEO Premium plugin v26.5 (Yoast SEO v27.9) - 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